1

R.F. sputtered silicon films on sapphire

Year:
1976
Language:
english
File:
PDF, 225 KB
english, 1976
6

1.9 Depth chemical profiles of MNOS structures measured by AES

Year:
1977
Language:
english
File:
PDF, 479 KB
english, 1977
7

Quantitative Auger electron analysis of homogeneous binary alloys of Cr, Fe and Ni

Year:
1992
Language:
english
File:
PDF, 1.16 MB
english, 1992
8

The influence of Ar+ and Xe+ ion beam incidence angle on the depth resolution in AES

Year:
1995
Language:
english
File:
PDF, 410 KB
english, 1995
9

Properties of amorphous silicon carbide films prepared by PECVD

Year:
1996
Language:
english
File:
PDF, 227 KB
english, 1996
10

AES of semi-insulating polycrystalline silicon layers

Year:
1996
Language:
english
File:
PDF, 610 KB
english, 1996
14

Characterisation of titanium disilicide thin films

Year:
2006
Language:
english
File:
PDF, 961 KB
english, 2006
15

Quantitative Auger electron spectroscopy of SiC

Year:
2006
Language:
english
File:
PDF, 175 KB
english, 2006
16

Nb-Ti/Al/Ni/Au based ohmic contacts to AlGaN/GaN

Year:
2007
Language:
english
File:
PDF, 405 KB
english, 2007
19

Chemical bevelling of CdTe and CdTe/MnTe structures

Year:
1998
Language:
english
File:
PDF, 413 KB
english, 1998
21

Diffusion Studies in Fe-Co-B Metallic Glasses

Year:
1992
Language:
english
File:
PDF, 181 KB
english, 1992
27

Estimation of the electron backscattering factor in AES

Year:
1989
Language:
english
File:
PDF, 386 KB
english, 1989
28

The innovation facilities of Auger spectrometer with energy modulation on CMA

Year:
1994
Language:
english
File:
PDF, 298 KB
english, 1994
30

Oral versus Topical NSAIDs in Rheumatic Diseases

Year:
2000
Language:
english
File:
PDF, 268 KB
english, 2000
47

Thin BSCCO films prepared by deposition from aerosol

Year:
1992
Language:
english
File:
PDF, 475 KB
english, 1992